ZEISS Live Webinar 28 January 2025, 12-13h

Multimodal and Multiscale 3D-EM-XRM-LM Volume Imaging for very large samples

In this webinar we will present a unique development that enables correlative microscopy by using a central software platform to bring together data from light, electron, ion and X-ray microscopy (XRM). Beyond simply correlating the different data sets, the approach allows data from one technique to be used to drive the hardware of another technique, facilitating easy transfer of information between the suite of microscopes implemented.

In a proof-of-concept approach, we have started to develop brain preparation, scanning and cross-correlation pipelines to exploit the virtues of complementary high-resolution neuroimaging techniques (MRI, 3D polarised light imaging, X-ray tomography, 3D SEM, Multibeam SEM (mSEM) and FIB SEM) applied serially to the same brain tissue. The main aim is to develop a multiscale approach that will allow, for example, the study of the human connectome from the millimetre to the nanometre scale.

Highligths of the webinar:

  • Central software platform integrates data from multiple microscopy techniques for correlative microscopy.
  • ZEISS's MultiSEM technology offers high-throughput imaging at 3 TeraPixels per hour using 91 electron beams.
  • Multiscale neuroimaging approach aims to study the human connectome using various imaging techniques on brain tissue.

ZEISS has recently developed a new multi-beam SEM (MSEM) technology for imaging large sample areas. The MultiSEM features 91 electron beams scanning in parallel, resulting in an imaging throughput of up to 3 TeraPixels per hour, enabling extremely large scale 2D and 3D imaging experiments.

Head & Time

Tuesday, 28 Januar 2025
12:00 - 13:00h

Details for the webinar login will be sent by e-mail the day before the event.

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Antonio Casares

Dr. Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 25 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.

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